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Measuring Instruments Product List

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Scan method FFP measurement device

Scan method FFP measurement device

FFP1003 is a system for measuring the angular distribution of light beams emitted from semiconductor lasers, LEDs, and optical fibers. By using a photodetector (PD), it achieves high sensitivity and a high dynamic range measurement, regardless of short-wavelength or long-wavelength bands. The adoption of a two-axis scanning method allows for the measurement of not only X profiles and XY profiles but also three-dimensional profiles. By controlling the precisely adjusted scanning and rotating optical system with an external PC, high-precision FFP measurements can be easily performed. ■Features ● Measurement of X profiles, XY profiles, and three-dimensional profiles ● Compatible with LDs, LEDs, and fibers in both short-wavelength and long-wavelength bands ● Capable of measuring with light levels below microW ● Intensity axis dynamic range > 40 dB ● Scanning angle range: ±60° and rotation angle range: 180°

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  • Other optical parts

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NFP measuring device

NFP measurement device

NFP1006 is a system for measuring the beam shape of optical waveguides, single-mode fibers, multi-mode fibers, plastic optical fibers, and semiconductor laser emission ends. By combining a camera system with a dedicated optical system, it measures the two-dimensional intensity distribution in real time. With a maximum magnification of ×100, it can measure with a resolution of up to 0.07μm. ■Features ● The theoretical resolution is 0.34μm when using the standard included ×20 objective lens, and 0.07μm when using the optional ×100 objective lens. ● It is equipped with various measurement and analysis functions. ● The maximum measurement repetition speed is 10 times per second. ● It has achieved a groundbreaking low price.

  • Microscope
  • Other optical parts

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